Laser Interferometer

Model：HY-IM200

Category：Optical Measurement

HY-IM200 Laser Interferometer uses dual-frequency laser source with high-precision optics for nanometer-level displacement measurement. Used for precision machine tool calibration, CMM verification, and precision sensor calibration.

Specifications

测量范围	0-40m
分辨率	1nm
精度	±0.5ppm
激光稳频精度	±0.05ppm

Features

• 双频激光稳频技术
• 1nm分辨率
• 环境补偿系统
• 配套专业分析软件